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NANOSCIENCE RESEARCH PLATFORM - SMARTMAT
UNIVERSITY OF ORADEA
Short link:
https://eeris.eu/
ERIF-2000-000G-0383
1009
Visits
SMARTMAT Laboratory is a research platform with activities in the field of nanoscience and advanced materials. Intended to serve as many researchers and colleagues as possible from University of Oradea, but not exclusively. The main activities that can be carried out are the determination of a wide variety of properties for surfaces using Nanoindentation, Scratch Testing, Atomic Force Microscopy [depending on the type of tip used, there are a multitude of characteristics that can be studied with...
Tiberiu
Vesselenyi
tvesselenyi@yahoo.co.uk
PhD Prof.
SCIENTIFIC TEAM
6
Traian COSTEA
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Luminita FRITEA
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Tătaru MIRCEA BOGDAN
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Ioan MOGA
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Liviu MOLDOVAN
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Moldovan OVIDIU GHEORGHE
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Analytical Facilities
RI Domain of activity
Materials Synthesis or Testing Facilities
RI Domain of activity
Material Science and Engineering
RI Domain of activity
Type Of RI:
Single sited RI
RI Life Cycle Status:
Active RI
Research Data Management Plan:
No information available
Access Policy to Research Infrastructure and Related Services:
No information available
Research Services
Young’s Modulus and Hardness Determination using Nanoindentation
SERVICE DESCRIPTION:
• Whit the G200 we can measure Young’s modulus and hardness in compliance with the ISO 14577 standard. We also can measure deformations over six orders of magnitude (from nanometers to millimeters). • Applications o – Semiconductor o – Thin films o – MEM structures o – Hard coatings o – DLC films o – Biomaterials
SERVICE PERSONS:
Liviu MOLDOVAN
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Traian COSTEA
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Material Surface Scratch Testing
SERVICE DESCRIPTION:
• Using the scratch method we can generate various kinds of behavior and damage mechanisms, which require different parameters to be described. The scratch mechanisms are often categorized as follows: Elastic-plastic behavior , Fracture behavior , Visco-elastic behavior. In order to study all these mechanisms, the standard scratch method creates a scratch recording the normal load, normal indenter displacement, tangential force, and indenter position on the sample. In addition, a cross profile is performed, giving access to information about pile-up height and width of the scratch under a specific load. • Applications o – Semiconductor o – Thin films o – MEM structures o – Hard coatings o – DLC films o – Biomaterials
SERVICE PERSONS:
Liviu MOLDOVAN
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Traian COSTEA
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Atomic Force Microscopy
SERVICE DESCRIPTION:
Atomic Force Microscopy (AFM) can resolve features as small as an atomic lattice, for either conductive or non-conductive samples. AFM provides high-resolution and three-dimensional information, with little sample preparation. The technique makes it possible to image in-situ, in fluid, under controlled temperature and in other controlled environments. The potential of AFM extends to applications in life science, materials science, electrochemistry, polymer science, biophysics, nanotechnology, and biotechnology.
SERVICE PERSONS:
Liviu MOLDOVAN
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Traian COSTEA
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Scanning Tunneling Microscopy
SERVICE DESCRIPTION:
The earliest, widely-adopted SPM technique was Scanning Tunneling Microscopy (STM). In STM, a bias voltage is applied between a sharp, conducting tip and the sample. When the tip approaches the sample, electrons “tunnel” through the narrow gap, either from the sample to the tip or vice versa, depending on the bias voltage. Changes of only 0.1 nm in the separation distance cause an order of magnitude difference in the tunneling current, giving STM remarkably high precision.
SERVICE PERSONS:
Liviu MOLDOVAN
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Traian COSTEA
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Current Sensing Atomic Force Microscopy
SERVICE DESCRIPTION:
Current Sensing AFM (CSAFM) uses standard AFM Contact Mode, including a special nose cone containing a pre-amp along with an ultra-sharp AFM cantilever coated with a conducting film, to probe the conductivity and topography of the sample. By applying a voltage bias between the conducting cantilever and sample, a current is generated which is used to construct a conductivity image. CSAFM is compatible with measurements in air, under controlled environments, and measurements with temperature control. The technique is useful in molecular recognition studies and can be used to spatially resolve electronic and ionic processes across cell membranes. It has proven useful in joint I/V spectroscopy and contact force experiments as well as contact potential studies.
SERVICE PERSONS:
Liviu MOLDOVAN
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Traian COSTEA
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Electrochemical research for sensing application
SERVICE DESCRIPTION:
Development of new electrochemical methods for the determination of various analytes from pharmaceutical, biomedical and environmental fields Design of new nanostructured platforms based on different nanomaterials and polymers for novel (bio)sensors elaboration
SERVICE PERSONS:
Luminita FRITEA
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Metallography
SERVICE DESCRIPTION:
Metallography sample preparation Analysis of metallography samples
SERVICE PERSONS:
Tătaru MIRCEA BOGDAN
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Moldovan OVIDIU GHEORGHE
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Ioan MOGA
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Research Equipment
Nano Indenter Agilent (Keysight) G200
CATALOG NAME:
U9820A Keysight Nano Indenter G200
DESCRIPTION:
The Nano Indenter G200 enables users to measure Young’s modulus and hardness in compliance with ISO 14577. The G200 also enables measurement of deformation over six orders of magnitude (from nano-meters to millimeters). Modular options can be added to accommodate a variety of applications. The capabilities of the G200 can be extended to facilitate frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10N, and customizable test protocols.
PRODUCER:
Agilent (Keysight)
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
100.001 € – 500.000 €
DATA SHEET:
Download data sheet file (480.78 kb)
Keysight 5500 Scanning Probe Microscope
CATALOG NAME:
5500 Atomic Force Microscope (AFM) (N9410S)
DESCRIPTION:
The Keysight Technologies, Inc. 5500 is the ideal multiple-user research system for atomic force microscopy. As the high-performance flagship of Keysight’s AFM instrument line, the 5500 provides atomic-scale resolution and a wealth of unique technological features, including patented top-down scanning, ultra-precision temperature control, and industryleading environmental control. It is well suited for life science, materials science, polymer science, electrical characterization, and nanolithography applications.
PRODUCER:
Agilent (Keysight)
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
100.001 € – 500.000 €
DATA SHEET:
Download data sheet file (1889.03 kb)
Metallogrphy Microscope
CATALOG NAME:
Huvitz HRM 300
DESCRIPTION:
Magnification: 100, 200, 500, 1000x. Digital cammera JENOPTIK - GRYPHAX Software for 2D imaging
PRODUCER:
Huvitz
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Optical Microscope Bifocal
CATALOG NAME:
BAX-T
DESCRIPTION:
Classical optical microscope
PRODUCER:
Esquire
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Zetasizer Nano series
CATALOG NAME:
Nano - ZS90
DESCRIPTION:
Zetasizer, Particle or molecular size and zeta potential determination.
PRODUCER:
Malvern
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Sample Preparation System Motopol 2000
CATALOG NAME:
Motopol 2000
DESCRIPTION:
Semi-automatic specimen preparation unit.Grinding and polishing operations. Disc speed 300 rpm, disc diameter 300 mm.
PRODUCER:
Buehler
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
LEO Scanning Electron Microscope (SEM)
CATALOG NAME:
LEO 438VP
DESCRIPTION:
Scanning electron microscope
PRODUCER:
LEO Electron Microscopy Ltd
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Phone:
40770297550
Fax:
Universitatii
,
1
,
Oradea
410087
,
Bihor
Romania
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